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Publicationer information ikon
Fabrication and characterization of IC compatible
through
-wafer polysilicon interconnects
Referentgranskad
Luusua, Ismo; Henttinen, Kimmo; Pekko, Panu; Vehmas, Tapani
ECS Transactions
2007
Publicationer information ikon
Fully tileable photodiode matrix for medical imaging by using
through
-wafer interconnects
Referentgranskad
DOI
10.1016/j.nima.2007.06.055
Juntunen, Mikko; Ji, Fan; Henttinen, Kimmo; Luusua, Ismo; Hietanen, Iiro; Eränen, Simo
Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detecto...
2007
Publicationer information ikon
Through
-wafer polysilicon interconnect fabrication with in-situ boron doping
Referentgranskad
DOI
10.1557/PROC-872-J5.5
Luusua, Ismo; Henttinen, Kimmo; Pekko, Panu; Vehmas, Tapani; Luoto, Hannu
MRS Online Proceedings
2005
Publicationer information ikon
Upside down T-shape
through
-wafer interconnects for fully tileable photodiode matrix for medical CT imaging
Referentgranskad
DOI
10.1016/j.sna.2012.06.025
Juntunen, Mikko; Ji, Fan; Hietanen, Iiro; Eränen, Simo
Sensors and Actuators A: Physical
2012
Publicationer information ikon
Fabrication of silicon based
through
-wafer interconnects for advanced chip scale packaging
Referentgranskad
DOI
10.1016/j.sna.2007.02.030
Ji, Fan; Leppävuori, Seppo; Luusua, Ismo; Henttinen, Kimmo; Eränen, Simo; Hietanen, Iiro; Juntunen, ...
Sensors and Actuators A: Physical
2008
Publicationer information ikon
Hermetic
wafer
level packaging of MEMS components using
through
silicon via and
wafer
to
wafer
bonding technologies
Referentgranskad
DOI
10.1109/ECTC.2013.6575770
Zoschke, K.; Manier, C.-A.; Wilke, M.; Jürgensen, N.; Oppermann, H.; Ruffieux, D.; Dekker, James; He...
Electronic Components and Technology Conference (ECTC)
2013
Publicationer information ikon
Wafer
scale packaging of MEMS by using plasma activated
wafer
bonding
Referentgranskad
Suni, Tommi; Henttinen, Kimmo; Lipsanen, Antti; Dekker, James; Luoto, Hannu; Kulawski, Martin
ECS Proceedings Volumes
2005
Publicationer information ikon
Conformance testing framework for service oriented
interconnection
technologies
Referentgranskad
Öppen tillgång
Keränen, Janne S.; Räty, Tomi; Jurmu, Petri; Mäki, Matti; Puolitaival, Olli-Pekka
International Journal of E-Business Development
2013
Publicationer information ikon
Tolerance management in
wafer
scale glass optics
Referentgranskad
Mäyrä, Aki; Mäkinen, Jukka-Tapani; Kondratyev, Vasily; Aikio, Janne
IMAPS Nordic Annual Conference 2014
2014
Publicationer information ikon
Solderless
Interconnection
and Packaging Technique for Embedded Active Components
Referentgranskad
Kujala, A.; Tuominen, R.; Kivilahti, J.
-
1999
Fabrication and characterization of IC compatible
through
-wafer polysilicon interconnects
Referentgranskad
2007
Fully tileable photodiode matrix for medical imaging by using
through
-wafer interconnects
Referentgranskad
DOI
10.1016/j.nima.2007.06.055
2007
Through
-wafer polysilicon interconnect fabrication with in-situ boron doping
Referentgranskad
DOI
10.1557/PROC-872-J5.5
2005
Upside down T-shape
through
-wafer interconnects for fully tileable photodiode matrix for medical CT imaging
Referentgranskad
DOI
10.1016/j.sna.2012.06.025
2012
Fabrication of silicon based
through
-wafer interconnects for advanced chip scale packaging
Referentgranskad
DOI
10.1016/j.sna.2007.02.030
2008
Hermetic
wafer
level packaging of MEMS components using
through
silicon via and
wafer
to
wafer
bonding technologies
Referentgranskad
DOI
10.1109/ECTC.2013.6575770
2013
Wafer
scale packaging of MEMS by using plasma activated
wafer
bonding
Referentgranskad
2005
Conformance testing framework for service oriented
interconnection
technologies
Referentgranskad
Öppen tillgång
2013
Tolerance management in
wafer
scale glass optics
Referentgranskad
2014
Solderless
Interconnection
and Packaging Technique for Embedded Active Components
Referentgranskad
1999
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